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circuit logo Karen Panetta Professor of Electrical and Computer Engineering and Dean of Graduate Education for the School of Engineering, Tufts University | IEEE Fellow

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LQM: Localized Quality Measure for Fingerprint Image Enhancement


July 30, 2019
by Karen Panetta

K. Panetta, S. Kamath K. M, S. Rajeev and S. S. Agaian, IEEE Access, vol. 7, pp. 104567-104576, 2019.

Posted in 2019, journal article
and
tagged with fingerprint identification, image enhancement, image matching, iterative methods, fingerprint image characteristics, LQM measure, retrievable-corrupt fingerprint regions, fingerprint image enhancement, low-quality fingerprint images, automated fingerprint identification systems, AFIS, image quality, automated enhancement process, novel localized quality measure, genetic localized quality measure enhancement algorithm, poor-quality fingerprint images, friction ridge structure, Fingerprint recognition, Image matching, Feature extraction, Sensor phenomena and characterization, Skin, Image enhancement, LQM, LQME, fingerprint, quality, enhancement, subjective, objective, measure
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