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circuit logo Karen Panetta Professor of Electrical and Computer Engineering and Dean of Graduate Education for the School of Engineering, Tufts University | IEEE Fellow

  • Home
  • About
    • Dr. Panetta
    • Contact
  • Research
    • Research Topics
    • Lab Members
    • Patents
    • Download
  • Publications
    • Journal Articles
    • Book Chapters
    • Books
    • Conference Papers
    • Magazine Articles
    • Newspaper Articles
  • Professional
    • IEEE
    • SPIE
    • SWE
  • Media
    • News
    • Events
    • Video
  • Teaching
  • Blog
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Viewing entries tagged
Skin

LQM: Localized Quality Measure for Fingerprint Image Enhancement

July 30, 2019

K. Panetta, S. Kamath K. M, S. Rajeev and S. S. Agaian, IEEE Access, vol. 7, pp. 104567-104576, 2019.

fingerprint identification, image enhancement, image matching, iterative methods, fingerprint image characteristics, LQM measure, retrievable-corrupt fingerprint regions, fingerprint image enhancement, low-quality fingerprint images, automated fingerprint identification systems, AFIS, image quality, automated enhancement process, novel localized quality measure, genetic localized quality measure enhancement algorithm, poor-quality fingerprint images, friction ridge structure, Fingerprint recognition, Image matching, Feature extraction, Sensor phenomena and characterization, Skin, Image enhancement, LQM, LQME, fingerprint, quality, enhancement, subjective, objective, measure

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