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circuit logo Karen Panetta Professor of Electrical and Computer Engineering and Dean of Graduate Education for the School of Engineering, Tufts University | IEEE Fellow

  • Home
  • About
    • Dr. Panetta
    • Contact
  • Research
    • Research Topics
    • Lab Members
    • Patents
    • Download
  • Publications
    • Journal Articles
    • Book Chapters
    • Books
    • Conference Papers
    • Magazine Articles
    • Newspaper Articles
  • Professional
    • IEEE
    • SPIE
    • SWE
  • Media
    • News
    • Events
    • Video
  • Teaching
  • Blog
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Viewing entries tagged
image quality measure

Novel multi-color transfer algorithms and quality measure

October 26, 2016

K. Panetta, L. Bao, and S. Agaian, IEEE Transactions on Consumer Electronics, vol. 62, pp. 292-300, 2016.

color transfer, image quality measure, full-reference measure, K-means, data visualization, special effects

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