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circuit logo Karen Panetta Professor of Electrical and Computer Engineering and Dean of Graduate Education for the School of Engineering, Tufts University | IEEE Fellow

  • Home
  • About
    • Dr. Panetta
    • Contact
  • Research
    • Research Topics
    • Lab Members
    • Patents
    • Download
  • Publications
    • Journal Articles
    • Book Chapters
    • Books
    • Conference Papers
    • Magazine Articles
    • Newspaper Articles
  • Professional
    • IEEE
    • SPIE
    • SWE
  • Media
    • News
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    • Video
  • Teaching
  • Blog
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Viewing entries tagged
learning

Neural Network-based Image Quality Comparator without Collecting the Human Score for Training

June 3, 2020

Bao, Long & Panetta, Karen. (2020).. IET Image Processing. 14. 10.1049/iet-ipr.2019.0809.

learning, Artificial Intelligence, Neural Networks, Image Classification, Feature extraction, Widely-Adapted image quality measure tests, providing accurate evaluation results, comparison accuracy, cross-dataset validation comparison tests, image training dataset, utilising human score, assigned distortion level differences, pairwise comparison results, training labels, training phase, four layer comparison network, input image, IQA performance, nonlinear combination strategy, IQC, similar-content image quality assessment, human behaviours, Neural network-based quality comparator

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